This assumption is problematic, particularly in complex data environments.

We implement gradient-based variational inference routines for Wishart and inverse Wishart processes, which we apply as Bayesian models for the dynamic, heteroskedastic covariance matrix ofamultivariate timeseries.

Fine-grained zero-shot learning task requires some form of side-information to transfer discriminative information from seen to unseen classes.

We develop scalable methods for producing conformal Bayesian predictive intervals with finite sample calibration guarantees.

We propose two novel tricks to tackle this challenge.

This paper studies the problem of approximately unlearning a Bayesian model from a small subset of the training data to be erased. We frame this problem as one of minimizing the Kullback-Leibler divergence between the approximate posterior belief of model parameters after directly unlearning from erased data vs. the exact posterior belief from retraining with remaining data. Using the variational inference (VI) framework, we show that it is equivalent to minimizing an evidence upper bound which trades off between fully unlearning from erased data vs. not entirely forgetting the posterior belief given the full data (i.e., including the remaining data); the latter prevents catastrophic unlearning that can render the model useless. In model training with VI, only an approximate (instead of exact) posterior belief given the full data can be obtained, which makes unlearning even more challenging. We propose two novel tricks to tackle this challenge. We empirically demonstrate our unlearning methods on Bayesian models such as sparse Gaussian process and logistic regression using synthetic and real-world datasets.

Virtually any model we use in machine learning to make predictions does not perfectly represent reality. So, most of the learning happens under model misspecification. In this work, we present a novel analysis of the generalization performance of Bayesian model averaging under model misspecification and i.i.d.

When faced with distribution shift at test time, deep neural networks often make inaccurate predictions with unreliable uncertainty estimates.While improving the robustness of neural networks is one promising approach to mitigate this issue, an appealing alternate to robustifying networks against all possible test-time shifts is to instead directly adapt them to unlabeled inputs from the particular distribution shift we encounter at test time.However, this poses a challenging question: in the standard Bayesian model for supervised learning, unlabeled inputs are conditionally independent of model parameters when the labels are unobserved, so what can unlabeled data tell us about the model parameters at test-time? In this paper, we derive a Bayesian model that provides for a well-defined relationship between unlabeled inputs under distributional shift and model parameters, and show how approximate inference in this model can be instantiated with a simple regularized entropy minimization procedure at test-time. We evaluate our method on a variety of distribution shifts for image classification, including image corruptions, natural distribution shifts, and domain adaptation settings, and show that our method improves both accuracy and uncertainty estimation.